Model: TRACKER 2800S
Semiconductor Device Test SetSpecial Features:
Waveform: sine wave; number of scan pins per channel: 40; scan modes: namual or atomatic; weight: 6 lbs
Properties:
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part TRACKER 2800S NSN 6625-01-583-5473
Material Classification
Hazardous material, precious metals, criticality, enviroment, and electrostatic discharge indicatorsFreight Classification
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Schedule B and Export
- Schedule B: 9030908030
- SITC: 87479
- End Use: Measuring, testing, control instruments
- NAICS: 334515
- USDA: 1
Freight Class: Parts and accessories of articles of schedule b subheading 9030.39
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